Machine vision technology has become a key tool for enhancing the production efficiency and quality of photovoltaic (PV) panels. From silicon wafer screening to solar cell inspection, and then to module testing, machine vision accurately identifies and eliminates defects such as micro-cracks, uneven diffusion, and false prints, ensuring quality control at every stage. Its efficient, non-contact inspection methods significantly shorten production cycles, reduce human errors, and improve the efficiency of photoelectric conversion and the lifespan of the cells. I-Tek has a broad layout in the photovoltaic field and, after a long period of cultivation, its products cover a wide range of scenarios including ingot inspection, wafer sorting, wafer stacking appearance inspection, rework laser wafer inspection, incoming wafer inspection, basket inspection, coating inspection, PL (Passivation Layer) inspection, graphite boat positioning/inspection, screen printing inspection, string welding inspection, appearance inspection before the second layout after lamination, EL (Electroluminescence) inspection and appearance inspection before and after lamination, appearance reverse inspection after edge trimming after lamination, junction box welding and inspection, and final inspection before shipment, building a hardware solution for full-process inspection. In addition to visible light products, I-Tek’s near-infrared and short-wave infrared products have the ability to penetrate, highlighting defect characteristics and identifying internal defects such as micro-cracks that are invisible to visible light. In high-speed inspection scenarios in photovoltaic production, their performance advantages are evident.